Integrated tooling for DO-178C testing for Deos RTOS users unveiled by DDC-I & LDRA
NewsJune 17, 2024
PHOENIX, Arizona, and WIRRAL, U.K. DDC-I and LDRA announced an enhanced integration between the Deos safety-critical DO-178C certifiable RTOS [real-time operating system] and the LDRA tool suite with the integrated solution qualified to Design Assurance Level A (DAL A),
According to the joint announcement, the collaborative Deos/LDRA tool suite leverages unique RTOS instrumentation hooks to deliver enhanced timing analysis and worst-case execution time (WCET) test capability, which is applicable for high-design-assurance systems and aimed at multicore system development.
Unlike conventional RTOS/unit test integrations, which use such chip-level facilities as special registers or timers, the companies say that Deos provides process log events with high-resolution time stamps that link what's going on at the process level with the kernel's more uniform/consistent view of time. These operating system-level hooks enable WCET measurement at both the system and task level using the developer’s interference-generation tool of choice.
