Talon Instruments' T940, high-speed digital testing system for legacy replacement and new test stations.

Eletter Product

EADS North America Test and Services, a division of EADS North America, Inc. launches its second generation Talon Instruments™ high-speed digital testing system for both legacy replacement and new test stations. The T940 Digital Subsystem, a single-wide, VXI 4.0-compatible module, provides a complete state-of-the-art digital solution at either a subsystem level or at a fully integrated system level.

The T940 Digital Resource Module (DRM) features dual sequencers that can function independently or synchronously for timing, memory, and control of the two front-end modules automatically. Sequencer logic supports full Unit Under Test (UUT) handshaking, formatting, patterns, looping, halt/pause-resume modes and conditional testing. The sequencer implements definable primary, standby, and idle sequences for simplified testing transitions.

The T940 Driver/Receiver daughter card types include a full selection of variable-voltage and fixed-voltage types, including 24 Volt swings, Transistor-Transistor Logic (TTL), Low Voltage TTL (LVTTL), Low Voltage Differential Signaling (LVDS), and RS-485.

The T940 DRMs form the backbone of a digital subsystem that may include switching, analog instrumentation, and even an RF subsystem. The wide ranging options of the T940 provide a digital subsystem optimized for the testing of aircraft/avionics, weapons systems, spacecraft, semiconductors, and medical devices.

Each T940 variable voltage sub-module is equipped with a custom-designed heat sink to provide optimal cooling. In addition, an on-board monitoring system protects the pin electronics from overheating and provides over-temperature, over-voltage and over-current shutdown. The new digital platform addresses concerns with overheating, while addressing legacy replacement and Test Program Set (TPS) investment with a modular, scalable, technically sophisticated solution.